The Bruker AXS D8 Advance X-Ray Diffractometer is housed in Manning Hall, in the Department of Physics.

The Bruker D8 ADVANCE has the ability to perform a full range of applications, from qualitative and quantitative phase identification, under ambient or non-ambient conditions, to crystal structure solution from powder samples, crystallite size determination, micro strain analysis, residual stress analysis, and preferred orientation.

Bruker X-ray diffractometer
Bruker AXS D8 Advance
SPECIFICATIONS:
X-RAY SOURCE
2.2kW Cu and Co, Running condiction (40kV, 40mA), Power stability is better than 0.01%
DETECTORS
Point detector, Vantec-1 detector
OPTICS
Gobel Mirror
GONIOMETER
High precision microprocessor controlled, two circle goniometer with independent stepper motors and optical encoders; Smallest angular step 0.0001°; Reproducibility +/- 0.0001°
SAMPLE STAGE
Centric ¼-Circle Eulerian Cradle.motorized Chi(tilt) and Phi(rotation) rotations and X-Y-Z translations. The cradle accommodates bulky specimens, powders, thin-films, and wafers up to 80 x 50 x 20 mm and weighing up to 1 kg
ATTACHEMENTS 
High Temperature MRI stage (RT-1400C), Thin Film Reflectometry, sample spinner, video camera, sample plate with 9-sample holders
SOFTWARE
LEPTOZ, TOPAZ, ICCD