Back to Integrated Microscopy Center Home
ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE

SEM

Brief Description

The FEI XL30 ESEM (Environmental Scanning Electron Microscope) can perform high vacuum, low vacuum and wet modes imaging from 1KV-30KV and 10X-100,000x magnification. It can be used to detect secondary electrons (SE), backscattered secondary electrons (BSE) in high vacuum SE and gaseous secondary electrons (GSE).

The XL30 ESEM is equipped with a Peltier stage (0oC to 37oC) and a heating stage (37oC up to 1000oC). Its maximum resolution under optimal conditions is 3.5nm.The XL30 also equipped with Energy Dispersive X-ray Spectroscopy (EDS) through an attached EDAX ultra-thin Beryllium window detector configurable for light element analysis down to Carbon.

 

 

 

Text Only | Print | Got a Question? Ask TOM | Contact Us | Memphis, TN 38152 | 901/678-2000 | Copyright 2014 University of Memphis | Important Notice | Last Updated: 
Last Updated: 9/25/14