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The IMC is equipped with two scanning electron microscopes (SEM) that enable observations in high and low vacuum as well as in wet mode. Elemental EDS analysis and mapping are also enabled as well as scanning transmission electron microscopy (STEM) and E-beam lithography. A critical point dryer and sputter coater are also available to prepare samples for SEM.

Staff in the facility help investigators define optimal experimental conditions for their project. SEM samples can be prepared by IMC staff or by investigators trained by IMC staff. Investigators have the option to request IMC staff to collect SEM data for their projects or to be trained by IMC staff to operate the SEM and collect the data themselves.

Scanning Electron Microscopy Equipment

Users interested in using the Scanning Electron Microscopes  and equipment should contact:

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Last Updated: 10/16/14