X-Ray Diffraction Applications

Phase identification

  • Thin-film analysis
  • Lattice parameter determination
  • Purity/quality control of materials
  • Determination of crystallinity of polycrystalline materials
  • Stress analysis
  • Orientation of single crystals
  • Particle size determination

Wide Angle Diffraction

  • Microdiffraction
  • Small Angle Scattering
  • X-ray Reflectometry
  • Temperature Control (RT-1400 C)
  • High Resolution Thin Film Analysis
  • Pole Figure Analysis
  • Reciprocal Space Mapping