Bruker D8 Advance X-ray Diffractomer (NSF Funded)
The state of the art Bruker D8 Advance XRD system is equipped with scintillation detector
and fast Vantec-1 detector. The system also has chi, phi, theta, and x-y-z motion.
A high temperature (RT-1400 oC) stage is easily mounted on the stage. Powerful software such as LEPTOS and TOPAPA
are used for the data analysis and modeling. The system is regularly used for performing
powder diffraction and thin film reflectrometry.
Atomic Force Microscope (AFM) (NSF Funded)
The Atomic Force Microscope DI 3000 is housed at the Integrated Microscopy Center. The microscope is equipped with phase imagining, magnetic
imaging, nanoindentation, surface potential, liquid cell, and inverted microscope.
Particle Size and Zeta Potential Analyzer
The DelsaNano S measures particles as small as 6 Angstrom and as large as 7 micron
with molecular weight as small as 267 Dalton in a concentration range from 10ppm to
40%* (w/v). It uses precision optics to avoid light intensity and coherence loss due
to fiber optics collection. The utilization of both log-scale and linear-scale correlators
makes broadest size range measurement possible. The system is also equipped with cell
to measure zeta potential of solid flat surfaces.
Vibrating Sample Magnetometer:
The vibrating sample magnetometer (VSM) is has air cooled 1.1T magnet. The system
is capable of performing RT hysteresis measurement.
Mossbauer Spectrometer (NSF-Funded):
Mossbauer spectroscopy (Seeco, Inc) is a resonance spectroscopy which uses Co gamma
source to probe iron atom and its coordination. This spectrometer is equipped with
LT (77K) and HT (500 C) attachments. The hyperfine parameters such as hyperfine field,
isomer shift and quadrupole shift provide wealth of information on the nature of iron
atom in the metal, oxides, and biological compounds.
AC Resistance/Inductance Bridge:
The low temperature AC bridge measures resistance of materials as a function of temperature
(10-400 K) and external magnetic field (500 Oe). The magnetic field is provided by
Helmholtz coils. The resistance is measured using four-probe method using Linear Research bridge.
The bridge is sensitive up to 1 micro Ohm reading. The sample stage is designed to
study giant-magneto resistance materials in the presence of in-plane magnetic field.
The entire setup is controlled by LabView. The bridge is also used to study susceptibility
and magnetization of magnetic materials using inductance method.
Temperature Dependent High Resistance
Resistivity in the range of giga Ohms of materials is measured using SVS Lab resistivity
bridge (TPR-EXP) in the temperature range of 295-500 K.
Magneto-resistance measurement device is a home build device. The device is capable
of measuring magneto-resistance as a function of magnetic field (maximum 2000 Oe)
and rotational angle of the sample. The resistance is measured using Keithly 330 source
meter in 4-point probe geometry and van der paw geometry. The system automated using
Dielectric property of materials is characterized using Agilent Fieldfox 14 GHz vector
network analyzer using Dielectric Assessment Kit (DAK) probe (SPEAG, Switzerland).
The dielectric probes is designed for fast, precise, non-destructive and easy to use
measurements of liquids, solids and semi-solids in the 200 MHz to 20 GHz frequency
range. The DAK software allows to view choice of the complex permittivity parameters
(ε', ε", σ, tanδ) in a variety of data formats (linear and logarithmic charts, Smith
chart, Cole-Cole plot and tabular).
Temperature dependent dielectric property of materials is characterized using SVS
Lab. dielectric analyzer (DEC-01) in the temperature range 295K to 500 K.
Precission Multiferroic System
Radiant Technology RT600, Precision Multiferroic test system is designed specifically
to characterize the electrical properties of non-linear materials. The Vision Software
allows the user to construct complex or simple programs with any number of tests to
characterize all aspects of the sample in one execution while keeping track of the
measurement results and the history of the sample being tested. A polarization hysteresis
measurement applies an electric field to the sample while measuring the change in
the sample polarization. Electric Field (E) and Polarization (D) are two of the six
thermodynamic properties of materials. The other four are Stress (T), Strain (S),
Temperature (Q) and Entropy (s). Of the six, all can be stimulated and/or measured
directly except for Entropy (s).
Differential Scanning Calorimeter:
Dupont DSC has a wide temperature range of operation from liquid nitrogen temperature
to 600 degree C. Thus, the equipment is used for thermal characterization of wide
range of materials from polymers, oxides, to metallic system. The DSC is computer
controlled and has data analysis software.
Dupont TGA has a wide temperature range of operation from RT to 1000 degree C. The TGA is computer controlled and has data analysis software.
The spectrophotometer (Ocean Optics) is a table top device with a UV-Vis-IR source,
optical fibers, gas cell, and CCD detector. The system is used to study the optical
properties of colloids and nanoparticles.
EnWave EZRaman-XB Spectrometer:
Fully integrated portable Raman system equipped with 785nm frequency stabilized 250 mW laser and with a spectral range of 250-2350 cm-1.
Thermo Scientific IR 100 has a spectral range of 7800 to 375 cm-1 with resolution
down to 4cm-1. The Nicolet IR100 FT-IR has inbuilt software and a sample compartment
mount for standard transmission accessories such as liquid cells, KBr pellets, and
ATR assembly. ATR assembly is equipped with ZnSe crystal.
Merlin High Performance Viscometer:
This temperature controlled (5-85 oC) The MERLIN viscometer is well suited for investigating the mixing, stirring, and
pumping behavior of coatings, emulsions, and dispersions, as well as for performing
conventional flow and viscosity profile experiments.The innovative design incorporates
a Peltier temperature control system that allows isothermal, step, and/or ramp temperature
Quantchrome Autosorb-I provides automated analysis of pore size and surface area measurement of variety of inroganic and organic materials, using variety of adsorbates.