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Characterization Techniques

Bruker D8 Advance X-ray Diffractomer (NSF Funded)

The state of the art Bruker D8 Advance XRD system is equipped with scintillation detector and fast Vantec-1 detector. The system also has chi, phi, theta, and x-y-z motion. xrdA high temperature (RT-1400 oC) stage is easily mounted on the stage. Powerful software such as LEPTOS and TOPAPA are used for the data analysis and modeling. The system is regularly used for performing powder diffraction and thin film reflectrometry.

Atomic Force Microscope (AFM) (NSF Funded)

The Atomic Force Microscope DI 3000 is housed at the afmIntegrated Microscopy Center. The microscope is equipped with phase imagining, magnetic imaging, nanoindentation, surface potential, liquid cell, and inverted microscope. 

 

 

 

Particle Size and Zeta Potential Analyzer

Delsa NanoS

Delsa nano

The DelsaNano S measures particles as small as 6 Angstrom and as large as 7 micron with molecular weight as small as 267 Dalton in a concentration range from 10ppm to 40%* (w/v). It uses precision optics to avoid light intensity and coherence loss due to fiber optics collection. The utilization of both log-scale and linear-scale correlators makes broadest size range measurement possible. The system is also equipped with cell to measure zeta potential of solid flat surfaces.

 

MAGNETIC CHARACTERIZATION

Vibrating Sample Magnetometer:

The vibrating sample magnetometer (VSM) is has air cooled 1.1T magnet. The system is capable of performing RT hysteresis measurement.

Mossbauer Spectrometer (NSF-Funded):

Mossbauer spectroscopy (Seeco, Inc) is a resonance spectroscopy which uses Co gamma source to probe iron atom and its coordination. This spectrometer is equipped with LT (77K) and HT (500 C) attachments. The hyperfine parameters such as hyperfine field, isomer shift and quadrupole shift provide wealth of information on the nature of iron atom in the metal, oxides, and biological compounds.

AC Resistance/Inductance Bridge:

The low temperature AC bridge measures resistance of materials as a function of temperature (10-400 K) and external magnetic field (500 Oe).  The magnetic field is provided by Helmholtz coils.  ltconductivityThe resistance is measured using four-probe method using Linear Research bridge.  The bridge is sensitive up to 1 micro Ohm reading.  The sample stage is designed to study giant-magneto resistance materials in the presence of in-plane magnetic field.  The entire setup is controlled by LabView. The bridge is also used to study susceptibility and magnetization of magnetic materials using inductance method.

Temperature Dependent High Resistance

Resistivity in the range of giga Ohms of materials is measured using SVS Lab resistivity bridge (TPR-EXP) in the temperature range of 295-500 K.

Magneto-resistance Measurement:

Magneto-resistance measurement device is a home build device. The device is capable of measuring magneto-resistance as a function of magnetic field (maximum 2000 Oe) and rotational angle of the sample. The resistance is measured using Keithly 330 source meter in 4-point probe geometry and van der paw geometry. The system automated using Labview program.

Dielectric Measurement

Frequency Dependent:

Dielectric property of materials is characterized using Agilent Fieldfox 14 GHz vector network analyzer using Dielectric Assessment Kit (DAK) probe (SPEAG, Switzerland). The dielectric probes is designed for fast, precise, non-destructive and easy to use measurements of liquids, solids and semi-solids in the 200 MHz to 20 GHz frequency range. The DAK software allows to view choice of the complex permittivity parameters (ε', ε", σ, tanδ) in a variety of data formats (linear and logarithmic charts, Smith chart, Cole-Cole plot and tabular).

Temperature Dependent:

Temperature dependent dielectric property of materials is characterized using SVS Lab. dielectric analyzer (DEC-01) in the temperature range 295K to 500 K.

 

 

THERMAL CHARACTERIZATION

Differential Scanning Calorimeter:

dsc

Dupont DSC has a  wide temperature range of operation from liquid nitrogen temperature to 600 degree C. Thus, the equipment is used for thermal characterization of wide range of materials from polymers, oxides, to metallic system. The DSC is computer controlled and has data analysis software.

 

 

 

Thermogravemetric Analyzer:

Dupont TGA has a  wide temperature range of operation from RT to 1000 degree C. Thtgae TGA is computer controlled and has data analysis software.

 

 

 

 

 

OPTICAL CHARACTERIZATION

UV-Vis-IR Spectrophotometer:

The spectrophotometer (Ocean Optics) is a table top device with a UV-Vis-IR source, optical fibers, gas cell, and CCD detector. The system is used to study the optical properties of colloids and nanoparticles.

EnWave EZRaman-XB Spectrometer:

Fully integrated portable Raman system equipped with raman785nm frequency stabilized 250 mW laser and with a spectral range of 250-2350 cm-1.

 

 

OTHER

Merlin High Performance Viscometer:

This viscometertemperature controlled (5-85 oC) The MERLIN viscometer is well suited for investigating the mixing, stirring, and pumping behavior of coatings, emulsions, and dispersions, as well as for performing conventional flow and viscosity profile experiments.The innovative design incorporates a Peltier temperature control system that allows isothermal, step, and/or ramp temperature profiles.

Autosorb-I:

Quantchrome Autosorb-I provides automated analysis of pore size and surface areaautoasorb1 measurement of variety of inroganic and organic materials, using variety of adsorbates.

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Department of Physics | Phone 901.678.2620 | Fax 901.678.4733 | 216 Manning Hall, Memphis, Tennessee 38152
Last Updated: 4/24/14