X-Ray Diffraction Applications

Phase identification

• Thin-film analysis
• Lattice parameter determination
• Purity/quality control of materials
• Determination of crystallinity of polycrystalline materials
• Stress analysis
• Orientation of single crystals
• Particle size determination

Wide Angle Diffraction

• Microdiffraction
• Small Angle Scattering
• X-ray Reflectometry
• Temperature Control (RT-1400 C)
• High Resolution Thin Film Analysis
• Pole Figure Analysis
• Reciprocal Space Mapping